A BIST Scheme for an SNR Test of a Sigma-Delta ADC
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چکیده
Built-In-Self-Test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-theeld diagnostics. This paper discusses a Mixed AnalogDigital BIST (MADBIST) for a Signal-to-Noise-Ratio test of an Analog-to-Digital Converter. The MADBIST strategy for the SNR test of the A/D Converter is introduced, accuracy issues are discussed, and experimental results are presented.
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تاریخ انتشار 1993